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Resolution degradation of semiconductor detectors due to carrier trapping

Kozorezov, Alexander G. and Wigmore, J. Keith and Owens, A. and den Hartog, R. and Peacock, A. and Al-Jawhari, H. A. (2005) Resolution degradation of semiconductor detectors due to carrier trapping. Nuclear Instruments and Methods A, 546 (1-2). pp. 209-212. ISSN 0168-9002

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Incomplete charge collection in semiconductor X-ray detectors due to carrier trapping is recognized as an important source of signal broadening. In this paper we show the results of calculations of energy resolution for a TlBr detector using an analytic approach developed in our earlier work in which fluctuations in the distribution of photon absorption sites are related to fluctuations in the collected charge. Using measured values of transport parameters for electrons and holes in the detector material we obtained excellent agreement with experiment in the X-ray energy range 6–660 keV.

Item Type: Article
Journal or Publication Title: Nuclear Instruments and Methods A
Uncontrolled Keywords: Semiconductor X-ray detector ; Carrier dynamics ; Energy resolution
Subjects: Q Science > QC Physics
Departments: Faculty of Science and Technology > Physics
ID Code: 9399
Deposited By: Ms Margaret Calder
Deposited On: 06 Jun 2008 15:14
Refereed?: Yes
Published?: Published
Last Modified: 17 Sep 2013 08:24
Identification Number:

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