YAMANAKA , K (1994) Interatomic force microscope and sample observing method therefor. G01B 11/30; G01B 21/30.
|PDF (patent (in Japanese)) - Published Version |
Download (274Kb) | Preview
PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.
|Uncontrolled Keywords:||Atomic force microscopy ; nonlinearity ; nanomechanics ; nanotechnology|
|Subjects:||Q Science > QC Physics|
?? 30 ??
|Departments:||Faculty of Science and Technology > Physics|
|Deposited On:||31 Oct 2012 15:15|
|Last Modified:||18 Jun 2016 04:57|
|Identification Number:||G01B 11/30; G01B 21/30|
Actions (login required)