YAMANAKA , K (1994) Interatomic force microscope and sample observing method therefor. G01B 11/30; G01B 21/30.
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Abstract
PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.
| Item Type: | Patent |
|---|---|
| Uncontrolled Keywords: | Atomic force microscopy ; nonlinearity ; nanomechanics ; nanotechnology |
| Subjects: | Q Science > QC Physics ?? 30 ?? |
| Departments: | Faculty of Science and Technology > Physics |
| ID Code: | 59435 |
| Deposited By: | ep_importer_pure |
| Deposited On: | 31 Oct 2012 15:15 |
| Refereed?: | No |
| Published?: | Published |
| Last Modified: | 26 Mar 2013 15:18 |
| Identification Number: | G01B 11/30; G01B 21/30 |
| URI: | http://eprints.lancs.ac.uk/id/eprint/59435 |
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