Lancaster EPrints

Interatomic force microscope and sample observing method therefor

YAMANAKA, K (1994) Interatomic force microscope and sample observing method therefor. G01B 11/30; G01B 21/30-JP-6323834.

PDF (patent (in Japanese)) - Published Version
Download (274Kb) | Preview


    PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.

    Item Type: Patent
    Uncontrolled Keywords: Atomic force microscopy ; nonlinearity ; nanomechanics ; nanotechnology
    Subjects: ?? qc ??
    ?? 30 ??
    Departments: Faculty of Science and Technology > Physics
    ID Code: 59435
    Deposited By: ep_importer_pure
    Deposited On: 31 Oct 2012 15:15
    Refereed?: No
    Published?: Published
    Last Modified: 14 Apr 2018 01:05
    Identification Number: G01B 11/30; G01B 21/30-JP-6323834

    Actions (login required)

    View Item