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The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality

Richardson, Andrew and Nicholson, Richard (1999) The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality. In: 5th IEEE International Mixed Signal Testing Workshop, 1999-06-151999-06-18, Whistler.

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    Abstract

    The neuMOS transistor is a comparatively new device developed in 1991 at Tohoku University, Japan, which is currently showing great promise in the direction of enhanced circuit functionality, particularly in Neural Network applications. In this paper we examine the possibilities of applying the inherent enhanced functionality of the neuMOS transistor to analogue and digital BIST. A novel concept is introduced which can extend existing sw-opamp structures. Finally, potential outgoing quality enhancement in VLSI neuMOS circuits over the CMOS equivalents are considered.

    Item Type: Conference or Workshop Item (Paper)
    Journal or Publication Title: 5th IEEE International Mixed Signal Testing Workshop
    Subjects:
    Departments: Faculty of Science and Technology > Engineering
    ID Code: 51060
    Deposited By: ep_importer_pure
    Deposited On: 15 Nov 2011 16:27
    Refereed?: Yes
    Published?: Published
    Last Modified: 10 Apr 2014 02:46
    Identification Number:
    URI: http://eprints.lancs.ac.uk/id/eprint/51060

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