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Reconfiguration based built-in self-test for analogue front-end circuits

Richardson, Andrew and Lechner, Andreas and Hermes, B. (1999) Reconfiguration based built-in self-test for analogue front-end circuits. In: 5th IEEE International Mixed Signal Testing Workshop, 1999-06-151999-06-18, Whistler.

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    Abstract

    Previous work has shown that it is feasible to implement a fully digital test evaluation function to realise partial self-test on an automatic gain control circuit (AGC). This paper extends the technique to INL, DNL, offset & gain error testing of analogue to digital converters (ADC's). It also shows how the same function can be used to test an AGC / ADC pair. An extension to full self-test is also proposed by the on-chip generation of input stimuli through reconfiguration of existing functions.

    Item Type: Conference or Workshop Item (Paper)
    Journal or Publication Title: 5th IEEE International Mixed Signal Testing Workshop
    Uncontrolled Keywords: mixed signal test ; Design for Testability
    Subjects: UNSPECIFIED
    Departments: Faculty of Science and Technology > Engineering
    ID Code: 51059
    Deposited By: ep_importer_pure
    Deposited On: 15 Nov 2011 16:23
    Refereed?: Yes
    Published?: Published
    Last Modified: 24 Jan 2014 06:15
    Identification Number:
    URI: http://eprints.lancs.ac.uk/id/eprint/51059

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