Richardson, Andrew and Lechner, Andreas and Hermes, B. (1999) Reconfiguration based built-in self-test for analogue front-end circuits. In: 5th IEEE International Mixed Signal Testing Workshop, 1999-06-151999-06-18.
|PDF - Submitted Version |
Available under License Creative Commons Attribution Non-commercial No Derivatives.
Download (1633Kb) | Preview
Previous work has shown that it is feasible to implement a fully digital test evaluation function to realise partial self-test on an automatic gain control circuit (AGC). This paper extends the technique to INL, DNL, offset & gain error testing of analogue to digital converters (ADC's). It also shows how the same function can be used to test an AGC / ADC pair. An extension to full self-test is also proposed by the on-chip generation of input stimuli through reconfiguration of existing functions.
|Item Type:||Conference or Workshop Item (Paper)|
|Journal or Publication Title:||5th IEEE International Mixed Signal Testing Workshop|
|Uncontrolled Keywords:||mixed signal test ; Design for Testability|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||15 Nov 2011 16:23|
|Last Modified:||02 Sep 2016 00:03|
Actions (login required)