Richardson, Andrew and Lechner, Andreas and Hermes, B. (1999) Reconfiguration based built-in self-test for analogue front-end circuits. In: 5th IEEE International Mixed Signal Testing Workshop, 1999-06-151999-06-18, Whistler.
![[img]](http://eprints.lancs.ac.uk/style/images/fileicons/application_pdf.png)
| PDF - Submitted Version Available under License Creative Commons Attribution Non-commercial No Derivatives. Download (1633Kb) | Preview |
Abstract
Previous work has shown that it is feasible to implement a fully digital test evaluation function to realise partial self-test on an automatic gain control circuit (AGC). This paper extends the technique to INL, DNL, offset & gain error testing of analogue to digital converters (ADC's). It also shows how the same function can be used to test an AGC / ADC pair. An extension to full self-test is also proposed by the on-chip generation of input stimuli through reconfiguration of existing functions.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Journal or Publication Title: | 5th IEEE International Mixed Signal Testing Workshop |
| Uncontrolled Keywords: | mixed signal test ; Design for Testability |
| Subjects: | UNSPECIFIED |
| Departments: | Faculty of Science and Technology > Engineering |
| ID Code: | 51059 |
| Deposited By: | ep_importer_pure |
| Deposited On: | 15 Nov 2011 16:23 |
| Refereed?: | Yes |
| Published?: | Published |
| Last Modified: | 27 Jul 2012 02:25 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/51059 |
Actions (login required)
| View Item |
