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Defect oriented test development based on inductive fault analysis

Richardson, Andrew and Kerkhoff, H G and Harvey, Russell (1995) Defect oriented test development based on inductive fault analysis. In: IEEE International Mixed Signal Test Workshop, 1995-06-201995-06-22, Vilard de Larns.

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    Abstract

    This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Converter are discussed and show that no single test method is superior.

    Item Type: Conference or Workshop Item (Paper)
    Journal or Publication Title: IEEE International Mixed Signal Test Workshop
    Uncontrolled Keywords: defect oriented test ; mixed signal test ; analogue test
    Subjects:
    Departments: Faculty of Science and Technology > Engineering
    ID Code: 51007
    Deposited By: ep_importer_pure
    Deposited On: 11 Nov 2011 11:48
    Refereed?: No
    Published?: Published
    Last Modified: 24 Jan 2014 06:15
    Identification Number:
    URI: http://eprints.lancs.ac.uk/id/eprint/51007

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