Richardson, Andrew and Kerkhoff, H G and Harvey, Russell (1995) Defect oriented test development based on inductive fault analysis. In: IEEE International Mixed Signal Test Workshop, 1995-06-201995-06-22, Vilard de Larns.
|PDF (Defect Oriented Test Development based on Inductive Fault Analysis) - Submitted Version |
Available under License Creative Commons Attribution Non-commercial No Derivatives.
Download (73Kb) | Preview
This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Converter are discussed and show that no single test method is superior.
|Item Type:||Conference or Workshop Item (Paper)|
|Journal or Publication Title:||IEEE International Mixed Signal Test Workshop|
|Uncontrolled Keywords:||defect oriented test ; mixed signal test ; analogue test|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||11 Nov 2011 11:48|
|Last Modified:||03 Nov 2015 22:38|
Actions (login required)