Richardson, Andrew and Kerkhoff, H G and Harvey, Russell (1995) Defect oriented test development based on inductive fault analysis. In: IEEE International Mixed Signal Test Workshop, 1995-06-201995-06-22, Vilard de Larns.
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Abstract
This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Converter are discussed and show that no single test method is superior.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Journal or Publication Title: | IEEE International Mixed Signal Test Workshop |
| Uncontrolled Keywords: | defect oriented test ; mixed signal test ; analogue test |
| Subjects: | UNSPECIFIED |
| Departments: | Faculty of Science and Technology > Engineering |
| ID Code: | 51007 |
| Deposited By: | ep_importer_pure |
| Deposited On: | 11 Nov 2011 11:48 |
| Refereed?: | No |
| Published?: | Published |
| Last Modified: | 27 Jul 2012 02:25 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/51007 |
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