Richardson, Andrew and Bratt, Adrian and Baturone, I and HUERTAS, J L (1995) The application of IDDX test strategies in analogue and mixed signal IC's. In: IEEE International Mixed Signal Test Workshop, 1995-06-201995-06-22, Vilard de Larns.
|PDF (The Application of IDDX Test Strategies to Mixed Signal IC's) - Submitted Version |
Available under License Creative Commons Attribution Non-commercial No Derivatives.
Download (128Kb) | Preview
Supply Current Testing (IDDQ) has become an important defect oriented test strategy for digital IC products. The technique takes advantage of the low quiescent supply current drawn by static CMOS circuits relative to the current consumption during state changes. However, in analogue and mixed signal IC’s this condition can rarely be observed, as in most circuits, steady state currents depend on the biasing conditions and the circuit design. This paper reviews analogue current monitoring proposals, investigates some of the problems related to the use of these techniques and attempts to categorise a number of analogue design styles against the probable suitability for current testing methodologies.
|Item Type:||Conference or Workshop Item (Paper)|
|Journal or Publication Title:||IEEE International Mixed Signal Test Workshop|
|Uncontrolled Keywords:||analogue test ; IDDQ • Reliability testing • Reliability indicators • Supply current testing • VLSI testing ; mixed signal test|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||11 Nov 2011 10:51|
|Last Modified:||13 Jan 2016 20:55|
Actions (login required)