Lechner, A and Ferguson, J and Richardson, A and Hermes, B (1999) A digital partial built-in self-test structure for a high performance automatic gain control circuit. In: DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS. IEEE COMPUTER SOC, LOS ALAMITOS, pp. 232-238. ISBN 0-7695-0078-1Full text not available from this repository.
It is now widely recognised that Design-for-Testability and Built-in Self-Test techniques rc ill be mandatory to meet test and quality specifications in next generation mired signal integrated systems. This paper describes a new digital on-chip post processing function capable of reducing production test time for a high performance automatic gain control circuit by 70%.
|Item Type:||Contribution in Book/Report/Proceedings|
|Uncontrolled Keywords:||DESIGN-FOR-TEST ; ANALOG ; BIST ; DAC ; ADC|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||25 Oct 2011 16:31|
|Last Modified:||02 Dec 2016 02:31|
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