Bratt, Adrian and Richardson, A. M. D. and Harvey, Russell and Dorey, A. P. (1995) A design-for-test structure for optimising analogue and mixed signal IC test. In: European Design and Test Conference. IEEE, pp. 24-33.
A new Design-for-Test (DfT) structure based on a configurable operational amplifier, referred to as a “swap amp” is presented that allows access to embedded analogue blocks. The structure has minimal impact on circuit performance and has been evaluated on a custom designed Phase Locked Loop (PLL) structure. A test chip containing faulty and fault free versions of this PLL structure, with and without DfT modifications, has been fabricated and an evaluation of this DfT scheme based on the swap-amp structure carried out. It is shown that for embedded analogue blocks, the DfT strategy can not only improve and simplify analogue and mixed signal IC test, but can also be used for diagnostics.
|Item Type: ||Contribution in Book/Report/Proceedings|
|Additional Information: ||"©1995 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder."|
|Subjects: ||T Technology > TA Engineering (General). Civil engineering (General)|
|Departments: ||Faculty of Science and Technology > Engineering|
|ID Code: ||20517|
|Deposited By: ||ep_ss_importer|
|Deposited On: ||05 Dec 2008 15:08|
|Last Modified: ||04 Nov 2015 04:40|
|Identification Number: |
Actions (login required)