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3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.

Lechner, A. and Burbidge, M. J. and Richardson, Andrew M. D. and Hermes, B. (2001) 3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs. In: Proceedings of the 2nd Latin-American test workshop (LATW ’01). , pp. 194-199.

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Item Type: Contribution in Book/Report/Proceedings
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 20259
Deposited By: ep_ss_importer
Deposited On: 22 Dec 2008 14:11
Refereed?: No
Published?: Published
Last Modified: 24 Jan 2014 05:57
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20259

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