Jeffery, Carl and Zhou, Xu and Richardson, Andrew M. D. (2005) Using bias superposition to test a thick film conductance sensor. Journal of Physics : Conference Series, 15. pp. 161-166. ISSN 1742-6588
Full text not available from this repository.Official URL: http://dx.doi.org/10.1088/1742-6596/15/1/027
Abstract
A novel on-line monitoring technique for a range of MEMS and integrated sensor systems is presented based on the injection of a test stimuli into the bias structure of transducer functions. The technique `Bias Superposition' utilises both signal injection and signal extraction techniques to achieve an indication of structural integrity of the transducer and interface. The technique has been successfully applied to a thick film conductance sensor.
| Item Type: | Article |
|---|---|
| Journal or Publication Title: | Journal of Physics : Conference Series |
| Additional Information: | Proceedings of the Sensors and their Applications XIII Conference. |
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Departments: | Faculty of Science and Technology > Engineering |
| ID Code: | 20081 |
| Deposited By: | ep_ss_importer |
| Deposited On: | 10 Dec 2008 09:51 |
| Refereed?: | No |
| Published?: | Published |
| Last Modified: | 26 Jul 2012 15:37 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/20081 |
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