Jeffery, Carl and Zhou, Xu and Richardson, Andrew M. D. (2005) Using bias superposition to test a thick film conductance sensor. Journal of Physics : Conference Series, 15. pp. 161-166. ISSN 1742-6588Full text not available from this repository.
A novel on-line monitoring technique for a range of MEMS and integrated sensor systems is presented based on the injection of a test stimuli into the bias structure of transducer functions. The technique `Bias Superposition' utilises both signal injection and signal extraction techniques to achieve an indication of structural integrity of the transducer and interface. The technique has been successfully applied to a thick film conductance sensor.
|Journal or Publication Title:||Journal of Physics : Conference Series|
|Additional Information:||Proceedings of the Sensors and their Applications XIII Conference.|
|Subjects:||T Technology > TA Engineering (General). Civil engineering (General)|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||10 Dec 2008 09:51|
|Last Modified:||26 Jul 2012 15:37|
Actions (login required)