Items where Author is "Radhakrishnan, K."

Yuan, K. and Radhakrishnan, K. and Zheng, H. Q. and Zhuang, Qiandong and Ing, G. I. (2001) Characterization of linearly graded metamorphic InGaP buffer layers on GaAs using high-resolution X-ray diffraction. Thin Solid Films, 391 (1). pp. 36-41. ISSN 0040-6090