Items where Author is "Mussbacher, Gunter"

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Number of items: 6.

Journal Article

Mussbacher, Gunter and Whittle, Jon and Amyot, Daniel (2010) Modeling and detecting semantic-based interactions in aspect-oriented scenarios. Requirements Engineering, 15 (2). pp. 197-214. ISSN 0947-3602

Contribution in Book/Report/Proceedings

Mussbacher, Gunter and Amyot, Daniel and Breu, Ruth and Bruel, Jean-Michel and Cheng, Betty H.C. and Collet, Phillipe and Combemale, Benoit and France, Robert and Heldal, Rogardt and Hill, James and Kienzle, Joerg and Schottle, Matthias and Steimann, Friedrich and Stikkolorum, Dave and Whittle, Jon (2014) The relevance of model-driven engineering thirty years from now. In: Model-driven engineering languages and systems : 17th International Conference, MODELS 2014, Valencia, Spain, September 28 – October 3, 2014. Proceedings. Lecture Notes in Computer Science . Springer, pp. 183-200. ISBN 9783319116525

Mussbacher, Gunter and Amyot, Daniel and Whittle, Jon (2013) Composing goal and scenario models with the aspect-oriented user requirements notation based on syntax and semantics. In: Aspect oriented requirements engineering :. Springer, Berlin, pp. 77-99. ISBN 9783642386398

Mussbacher, Gunter and Amyot, Daniel and Whittle, Jon (2009) Refactoring-Safe Modeling of Aspect-Oriented Scenarios. In: Model driven engineering languages and systems : 12th international conference, MODELS 2009, Denver, CO, USA, October 4-9, 2009 : proceedings. Lecture Notes in Computer Science . Springer-Verlag, Denver, pp. 286-300. ISBN 978-3-642-04424-3

Mussbacher, Gunter and Amyot, Daniel and Whittle, Jon (2009) Semantic-Based Aspect Interaction Detection with Goal Models (position paper). In: Feature interactions in software and communication systems X :. IOS Press, Lisbon, pp. 176-182. ISBN 978-1-60750-014-8

Mussbacher, Gunter and Whittle, Jon and Amyot, Daniel (2009) Semantic-Based Interaction Detection in Aspect-Oriented Scenarios. In: Requirements Engineering Conference, 2009. RE '09. 17th IEEE International :. IEEE, Atlanta, pp. 203-212. ISBN 978-0-7695-3761-0

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