Items where Author is "Langford, R. M."
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Contribution in Book/Report/Proceedings
Huey, B. D. and Langford, R. M. and Briggs, G. Andrew D. and Kolosov, Oleg (2001) Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy. In: Microscopy of Semiconducting Materials 2001 :. IOP Publishing Ltd, OXFORD, pp. 531-534. ISBN 0-7503-0818-4