Items where Author is "Huebener, R. P."

Journal Article

Ustinov, A. V. and Lemke, S. and Doderer, T. and Huebener, R. P. and Kuzmin, L. S. and Pashkin, Yu A. (1994) Application of low temperature scanning electron microscopy for the investigation of single-electron tunneling circuits. Journal of Applied Physics, 76 (1). pp. 376-384. ISSN 0021-8979