Items where Author is "Hoyer, W."

Bozsoki, P. and Thomas, P. and Kira, M. and Hoyer, W. and Meier, T. and Koch, S. W. and Maschke, K. and Varga, I. and Stolz, H. (2006) Characterisation of disorder in semiconductors via single-photon interferometry. Physical review letters, 97 (22). 227402 (4 pages).