Items where Author is "Harvey, Russell"

Richardson, Andrew and Kerkhoff, H G and Harvey, Russell (1995) Defect oriented test development based on inductive fault analysis. In: IEEE International Mixed Signal Test Workshop, 1995-06-20 - 1995-06-22.

Bratt, Adrian and Richardson, A. M. D. and Harvey, Russell and Dorey, A. P. (1995) A design-for-test structure for optimising analogue and mixed signal IC test. In: European Design and Test Conference :. IEEE, pp. 24-33.

Harvey, Russell and Richardson, A. M. D. and Baker, K. and Bruls, E. (1994) Analogue Fault Simulation Based on Layout-Dependent Fault Models. In: Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years :. IEEE Computer Society, Washington, DC, USA, pp. 641-649. ISBN 0-7803-2103-0.