Items where Author is "Deshpande, Nihal"

Journal Article

Ridgard, George and Thompson, Michael and Schreckenberg, Lea and Deshpande, Nihal and Cabrera-Galicia, Alfonso and Bourgeois, Olivier and Doebele, Victor and Prance, Jonathan (2025) Voltage noise thermometry in integrated circuits at millikelvin temperatures. Journal of Applied Physics, 137 (24): 245901. ISSN 0021-8979