Brenning, Henrik T. A. and Kubatkin, Sergey E. and Erts, Donats and Kafanov, Sergey and Bauch, Thilo and Delsing, Per (2006) A single electron transistor on an atomic force microscope probe. Nano Letters, 6 (5). pp. 937-941. ISSN 1530-6984
Full text not available from this repository.Abstract
We report fabrication as well as proof-of-concept experiments of a noninvasive sensor of weak nanoscale electric fields. The sensor is a single electron transistor (SET) placed at the tip of a noncontact atomic force microscope (AFM). This is a general technology to make any nanometer-sized lithography pattern at edges or tips of a cantilever. The height control of the AFM allows the SET to hover a few nanometers above the substrate, improving both the electric field sensitivity and lateral resolution of the electrometer. Our AFM-SET sensor is prepared by a scalable technology. It means that the probe can be routinely fabricated and replaced, if broken.