Identifying passivated dynamic force microscopy tips on H:Si(100)

Sharp, Peter and Jarvis, Samuel and Woolley, Richard and Sweetman, Adam and Kantorovich, Lev and Pakes, Chris and Moriarty, Philip (2012) Identifying passivated dynamic force microscopy tips on H:Si(100). Applied Physics Letters, 100 (23). ISSN 0003-6951

Full text not available from this repository.

Abstract

The chemical reactivity of the tip plays a central role in image formation in dynamic force microscopy, but in very many cases the state of the probe is a key experimental unknown. We show here that an H-terminated and thus chemically unreactive tip can be readily identified via characteristic imaging and spectroscopic (F(z)) signatures, including, in particular, contrast inversion, on hydrogen-passivated Si(100). We determine the tip apex termination by comparing site-specific difference force curves with the results of density functional theory, providing a clear protocol for the identification of chemically unreactive tips on silicon surfaces.

Item Type:
Journal Article
Journal or Publication Title:
Applied Physics Letters
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/3100/3101
Subjects:
ID Code:
83490
Deposited By:
Deposited On:
06 Dec 2016 11:44
Refereed?:
Yes
Published?:
Published
Last Modified:
01 Jan 2020 10:07