Area-to-point regression kriging for pan-sharpening

Wang, Qunming and Shi, Wenzhong and Atkinson, Peter Michael (2016) Area-to-point regression kriging for pan-sharpening. ISPRS Journal of Photogrammetry and Remote Sensing, 114. pp. 151-165. ISSN 0924-2716

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Pan-sharpening is a technique to combine the fine spatial resolution panchromatic (PAN) band with the coarse spatial resolution multispectral bands of the same satellite to create a fine spatial resolution multispectral image. In this paper, area-to-point regression kriging (ATPRK) is proposed for pan-sharpening. ATPRK considers the PAN band as the covariate. Moreover, ATPRK is extended with a local approach, called adaptive ATPRK (AATPRK), which fits a regression model using a local, non-stationary scheme such that the regression coefficients change across the image. The two geostatistical approaches, ATPRK and AATPRK, were compared to the 13 state-of-the-art pan-sharpening approaches summarized in Vivone et al. (2015) in experiments on three separate datasets. ATPRK and AATPRK produced more accurate pan-sharpened images than the 13 benchmark algorithms in all three experiments. Unlike the benchmark algorithms, the two geostatistical solutions precisely preserved the spectral properties of the original coarse data. Furthermore, ATPRK can be enhanced by a local scheme in AATRPK, in cases where the residuals from a global regression model are such that their spatial character varies locally.

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Journal Article
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ISPRS Journal of Photogrammetry and Remote Sensing
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17 Aug 2016 09:30
Last Modified:
22 Nov 2022 03:37