Analysis of measurement uncertainty in THz-TDS

Withayachumnankul, W. and Lin, Hungyen and Mickan, S. P. and Fischer, Bernd M. and Abbott, Derek (2007) Analysis of measurement uncertainty in THz-TDS. In: Proceedings of SPIE. Proceedings of SPIE, 6593 . SPIE.

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Abstract

Measurement precision is often required in the process of material parameter extraction. This fact is applicable to terahertz time-domain spectroscopy (THz-TDS), which is able to determine the optical/dielectric constants of material in the T-ray regime. Essentially, an ultrafast-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision. In operation, the uncertainties of these parts, along with the uncertainties introduced during the parameter extraction process, contribute to the overall uncertainty appearing at the output, i.e. the uncertainty in the extracted optical constants. This paper analyzes the sources of uncertainty and models error propagation through the process.

Item Type:
Contribution in Book/Report/Proceedings
ID Code:
76862
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Deposited On:
24 Nov 2015 16:04
Refereed?:
Yes
Published?:
Published
Last Modified:
17 Jun 2020 09:23