Comprehensive modeling of THz microscope with a sub-wavelength source

Lin, Hungyen and Fumeaux, Christophe and Ung, B. S. Y. and Abbott, Derek (2011) Comprehensive modeling of THz microscope with a sub-wavelength source. Optics Express, 19 (6). pp. 5327-5338. ISSN 1094-4087

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Abstract

The sub-wavelength THz emission point on a nonlinear electro-optical crystal, used in broadband THz near-field emission microscopy, is computationally modeled as a radiating aperture of Gaussian intensity profile. This paper comprehensively studies the Gaussian aperture model in the THz near-field regime and validates the findings with dual-axis knife-edge experiments. Based on realistic parameter values, the model allows for THz beam characterisation in the near-field region for potential microscopy applications. An application example is demonstrated by scanning over a cyclic-olefin copolymer sample containing grooves placed sub-wavelengths apart. The nature of THz microscopy in the near-field is highly complex and traditionally based on experiments. The proposed validated numerical model therefore aids in the quantitative understanding of the performance parameters. Whilst in this paper we demonstrate the model on broadband electro-optical THz near-field emission microscopy, the model may apply without a loss of generality to other types of THz near-field focused beam techniques.

Item Type:
Journal Article
Journal or Publication Title:
Optics Express
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/3100/3107
Subjects:
ID Code:
76837
Deposited By:
Deposited On:
24 Nov 2015 10:18
Refereed?:
Yes
Published?:
Published
Last Modified:
24 Mar 2020 04:32