Low secondary electron yield engineered surface for electron cloud mitigation

Valizadeh, Reza and Malyshev, Oleg B. and Wang, Sihui and Zolotovskaya, Svetlana and Gillespie, W. Allan and Abdolvand, Amin (2014) Low secondary electron yield engineered surface for electron cloud mitigation. Applied Physics Letters, 105 (23). ISSN 0003-6951

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Abstract

Secondary electron yield (SEY or δ) limits the performance of a number of devices. Particularly, in high-energy charged particle accelerators, the beam-induced electron multipacting is one of the main sources of electron cloud (e-cloud) build up on the beam path; in radio frequency wave guides, the electron multipacting limits their lifetime and causes power loss; and in detectors, the secondary electrons define the signal background and reduce the sensitivity. The best solution would be a material with a low SEY coating and for many applications δ < 1 would be sufficient. We report on an alternative surface preparation to the ones that are currently advocated. Three commonly used materials in accelerator vacuum chambers (stainless steel, copper, and aluminium) were laser processed to create a highly regular surface topography. It is shown that this treatment reduces the SEY of the copper, aluminium, and stainless steel from δmax of 1.90, 2.55, and 2.25 to 1.12, 1.45, and 1.12, respectively. The δmax further reduced to 0.76-0.78 for all three treated metals after bombardment with 500 eV electrons to a dose between 3.5 × 10-3 and 2.0 × 10-2 C·mm-2.

Item Type:
Journal Article
Journal or Publication Title:
Applied Physics Letters
Additional Information:
Copyright 2014 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 105 (23), 2014 and may be found at http://scitation.aip.org/content/aip/journal/apl/105/23/10.1063/1.4902993
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/3100/3101
Subjects:
ID Code:
76613
Deposited By:
Deposited On:
11 Nov 2015 09:46
Refereed?:
Yes
Published?:
Published
Last Modified:
27 Oct 2020 05:14