Identifying single electron charge sensor events using wavelet edge detection

Prance, Jonathan and Van Bael, B. J. and Simmons, C. B. and Savage, D. E. and Lagally, M. G. and Friesen, Mark and Coppersmith, S. N. and Eriksson, M. A. (2015) Identifying single electron charge sensor events using wavelet edge detection. Nanotechnology, 26 (21). ISSN 0957-4484

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Abstract

The operation of solid-state qubits often relies on single-shot readout using a nanoelectronic charge sensor, and the detection of events in a noisy sensor signal is crucial for high fidelity readout of such qubits. The most common detection scheme, comparing the signal to a threshold value, is accurate at low noise levels but is not robust to low-frequency noise and signal drift. We describe an alternative method for identifying charge sensor events using wavelet edge detection. The technique is convenient to use and we show that, with realistic signals and a single tunable parameter, wavelet detection can outperform thresholding and is significantly more tolerant to 1/f and low-frequency noise.

Item Type:
Journal Article
Journal or Publication Title:
Nanotechnology
Additional Information:
This is an author-created, un-copyedited version of an article accepted for publication/published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at doi:10.1088/0957-4484/26/21/215201. © 2015 IOP Publishing
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2200/2208
Subjects:
ID Code:
73771
Deposited By:
Deposited On:
18 Jun 2015 05:44
Refereed?:
Yes
Published?:
Published
Last Modified:
28 Nov 2020 02:58