Multidimensional SPM applied for Nanoscale Conductance Mapping

Bosse, James L. and Grishin, Ilja and Kolosov, Oleg and Huey, Bryan D. (2013) Multidimensional SPM applied for Nanoscale Conductance Mapping. Journal of Materials Research, 28 (24). pp. 3311-3321. ISSN 2044-5326

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Abstract

A new approach has been developed for nanoscale conductance mapping (NCM) based on multidimensional atomic force microscopy (AFM) to efficiently investigate the nanoscale electronic properties of heterogeneous surfaces. The technique uses a sequence of conductive AFM images, all acquired in a single area but each with incrementally higher applied voltages. This generates a matrix of current versus voltage (I–V) spectra, providing nanoscale maps of conductance and current nonlinearities with negligible spatial drift. For crystalline and amorphous phases of a GeSe chalcogenide phase change film, conductance and characteristic amorphous phase “turn-on” voltages are mapped with results providing traditional point-by-point I–V measurements, but acquired hundreds of times faster. Although similar to current imaging tunneling spectroscopy in a scanning tunneling microscope, the NCM technique does not require conducting specimens. It is therefore a promising approach for efficient, quantitative electronic investigations of heterogeneous materials used in sensors, resistive memories, and photovoltaics.

Item Type:
Journal Article
Journal or Publication Title:
Journal of Materials Research
Additional Information:
http://journals.cambridge.org/action/displayJournal?jid=JMR The final, definitive version of this article has been published in the Journal, Journal of Materials Research, 28 (24), pp 3311-3321 2013, © 2013 Cambridge University Press.
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/3100/3104
Subjects:
ID Code:
68179
Deposited By:
Deposited On:
02 Jan 2014 09:02
Refereed?:
Yes
Published?:
Published
Last Modified:
02 Dec 2020 01:52