On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination

Bowen, James and Cheneler, David and Walliman, Dominic and Arkless, Stuart G. and Zhang, Zhibing and Ward, Michael C. L. and Adams, Michael J. (2010) On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination. Measurement Science and Technology, 21 (11). ISSN 0957-0233

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Abstract

A simple but effective method for estimating the spring constant of commercially available atomic force microscope (AFM) cantilevers is presented, based on estimating the cantilever thickness from knowledge of its length, width, resonant frequency and the presence or absence of an added mass, such as a colloid probe at the cantilever apex, or a thin film of deposited material. The spring constant of the cantilever can then be estimated using standard equations for cantilever beams. The results are compared to spring constant calibration measurements performed using reference cantilevers. Additionally, the effect of the deposition of Cr and Ti thin films onto rectangular Si cantilevers is investigated.

Item Type:
Journal Article
Journal or Publication Title:
Measurement Science and Technology
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2600/2604
Subjects:
ID Code:
67481
Deposited By:
Deposited On:
08 Nov 2013 10:19
Refereed?:
Yes
Published?:
Published
Last Modified:
29 Jan 2020 07:39