Application of colloid probe atomic force microscopy to the adhesion of thin films of viscous and viscoelastic silicone fluids

Bowen, James and Cheneler, David and Andrews, James W. and Avery, Andrew R. and Zhang, Zhibing and Ward, Michael C. L. and Adams, Michael J. (2011) Application of colloid probe atomic force microscopy to the adhesion of thin films of viscous and viscoelastic silicone fluids. Langmuir, 27 (18). pp. 11489-11500. ISSN 0743-7463

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Abstract

The adhesive characteristics of thin films (0.2-2 μm) of linear poly(dimethylsiloxane) (PDMS) liquids with a wide range of molecular weights have been measured using an atomic force microscope with a colloid probe (diameters 5 and 12 μm) for different separation velocities. The data were consistent with a residual film in the contact region having a thickness of ∼6 nm following an extended dwell time before separation of the probe. It was possible to estimate the maximum adhesive force as a function of the capillary number, Ca, by applying existing theoretical models based on capillary interactions and viscous flow except at large values of Ca in the case of viscoelastic fluids, for which it was necessary to develop a nonlinear viscoelastic model. The compliance of the atomic force microscope colloid beam was an important factor in governing the retraction velocity of the probe and therefore the value of the adhesive force, but the inertia of the beam and viscoelastic stress overshoot effects were not significant in the range of separation velocities investigated.

Item Type: Journal Article
Journal or Publication Title: Langmuir
Uncontrolled Keywords: /dk/atira/pure/subjectarea/asjc/3100/3104
Subjects:
Departments: Faculty of Science and Technology > Engineering
ID Code: 67320
Deposited By: ep_importer_pure
Deposited On: 29 Oct 2013 09:27
Refereed?: Yes
Published?: Published
Last Modified: 01 Jan 2020 08:41
URI: https://eprints.lancs.ac.uk/id/eprint/67320

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