Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes

Stone, R and Rosamond, Mark C. and Coleman, K and Petty, Michael C. and Kolosov, Oleg and Bowen, L and Zeze, Dagou A. (2013) Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes. Review of Scientific Instruments, 84 (3). ISSN 1089-7623

Full text not available from this repository.

Abstract

The benefits of a new electrochemical etching method for the controlled sharpening of sub-micron tungsten probes are demonstrated. The proposed technique only utilizes the insulating effect of the WO42− by-product which offers more practical ways of controlling the process parameters. The electrosharpening method was fully automated through the analysis of the process current, bulk coulometry, shadowgraphs, and time lapse microscopy. Tip radii smaller than 15 nm were maintained over a wide range of controlled lengths up to 4.5 mm with conic angles of less than 1°.

Item Type:
Journal Article
Journal or Publication Title:
Review of Scientific Instruments
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/3100/3105
Subjects:
ID Code:
63291
Deposited By:
Deposited On:
08 Apr 2013 15:28
Refereed?:
Yes
Published?:
Published
Last Modified:
22 Jul 2020 11:06