Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50mm

Adams, Jamie and Joyce, Malcolm and Mellor, M. (2012) Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50mm. Applied Radiation and Isotopes, 70 (7). 1150–1153. ISSN 0969-8043

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Abstract

A phantom has been used to position two radiation sources, separately, when buried under dry-silica sand at depths between 5 and 50 mm. A γ-ray energy spectrum was then measured at every 1 mm depth. Principal component analysis has been conducted, which has led to anon-linear fit being established, allowing the depth of entrainment to be accurately inferred. The technique has been expanded for additional shielding media: water, aggregate and both wet and dry soil. The technique has also been expanded beyond the previous depth constraint of 50 mm.

Item Type:
Journal Article
Journal or Publication Title:
Applied Radiation and Isotopes
Uncontrolled Keywords:
/dk/atira/pure/core/keywords/engineering
Subjects:
?? depth profilingradioactive contaminationgamma spectrometrycadmium tellurideprincipal component analysisshieldingengineeringradiationta engineering (general). civil engineering (general) ??
ID Code:
60024
Deposited By:
Deposited On:
16 Nov 2012 10:26
Refereed?:
Yes
Published?:
Published
Last Modified:
13 Sep 2024 14:35