Photon radiation testing of commercially available off-the-shelf microcontroller devices

Bandala Sánchez, Manuel and Joyce, Malcolm (2012) Photon radiation testing of commercially available off-the-shelf microcontroller devices. IEICE Electronics Express, 9 (5). pp. 397-402.

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Abstract

The results of photon radiation testing of various microcontroller devices is described. This was testing was useful to select the microcontroller in a 6DOF MEMS-based INS. This systems is being developed for the in-vivo monitoring of tumour position during clinical radiotherapy treatments. This application requires a radiation-tolerant processor in order to perform appropriately in a radiotherapy environment. A phantom has been built to replicate the working conditions that the microcontroller devices are required to endure. Each time, a number of identical microcontroller devices have been exposed, in 5turn, to X-ray doses in excess of 50 Gy from a clinical radiotherapy LINAC.

Item Type:
Journal Article
Journal or Publication Title:
IEICE Electronics Express
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
ID Code:
60023
Deposited By:
Deposited On:
16 Nov 2012 10:07
Refereed?:
Yes
Published?:
Published
Last Modified:
01 Jan 2020 08:13