Interatomic force microscope and sample observing method therefor

YAMANAKA , K (1996) Interatomic force microscope and sample observing method therefor. G01B 11/30; G01B 21/30.

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PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.

Item Type: Patent
Uncontrolled Keywords: /dk/atira/pure/researchoutput/libraryofcongress/qc
Departments: Faculty of Science and Technology > Physics
ID Code: 58947
Deposited By: ep_importer_pure
Deposited On: 30 Oct 2012 15:43
Refereed?: No
Published?: Published
Last Modified: 20 Oct 2019 03:47

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