Determination of bonding in amorphous carbons by electron energy loss spectroscopy, Raman scattering and X-ray reflectivity

Ferrari, A.C and Kleinsorge, B and Adamopoulos, George and Robertson, J and Milne, W.I and Stolojan, V and Brown, L.M and LiBassi, A and Tanner, B.K (2000) Determination of bonding in amorphous carbons by electron energy loss spectroscopy, Raman scattering and X-ray reflectivity. Journal of Non-Crystalline Solids, 266-26. pp. 765-768. ISSN 0022-3093

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Abstract

X-ray reflectivity (XRR) and Raman scattering are developed as non-destructive methods to find the density and sp(3) content of unhydrogenated and hydrogenated amorphous carbon films. An empirical relationship is found to derive the sp(3) fraction from visible Raman spectra, while ultraviolet (UV) Raman is able to directly detect sp(3) sites. The sp(3) fraction and density are linearly correlated in amorphous carbon (a-C) and hydrogenated amorphous carbon (a-C:H) films.

Item Type:
Journal Article
Journal or Publication Title:
Journal of Non-Crystalline Solids
Uncontrolled Keywords:
/dk/atira/pure/core/keywords/engineering
Subjects:
?? diamond-like carbonengineeringmaterials chemistryceramics and compositeselectronic, optical and magnetic materialscondensed matter physicsta engineering (general). civil engineering (general) ??
ID Code:
58583
Deposited By:
Deposited On:
29 Oct 2012 16:48
Refereed?:
Yes
Published?:
Published
Last Modified:
15 Jul 2024 13:16