Domain structure and polarization reversal in ferroelectrics studied by atomic force microscopy

Gruverman, Alexei and Kolosov, Oleg and Hatano, Jun and Takahashi, Koichiro and Tokumoto, H. (1995) Domain structure and polarization reversal in ferroelectrics studied by atomic force microscopy. Journal of Vacuum Science and Technology B, 13 (3). pp. 1095-1099. ISSN 1071-1023

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Abstract

The ferroelectric domain structure and its dynamics under applied electric field have been studied with nanoscale resolution by atomic force microscopy (AFM). Two mechanisms responsible for the contrast between opposite domains are proposed: large built‐in domains are delineated in friction mode due to the tip–sample electrostatic interaction, and small domains created by an external field are imaged in topography mode due to piezoelectric deformation of the crystal. The ability of effective control of ferroelectric domains by applying a voltage between the AFM tip and the bottom electrode is demonstrated. It is experimentally confirmed that the sidewise growth of domain proceeds through the nucleation process on the domain wall.

Item Type:
Journal Article
Journal or Publication Title:
Journal of Vacuum Science and Technology B
Uncontrolled Keywords:
/dk/atira/pure/core/keywords/physics
Subjects:
?? physicselectrical and electronic engineeringcondensed matter physicsqc physics ??
ID Code:
57413
Deposited By:
Deposited On:
07 Oct 2012 14:02
Refereed?:
Yes
Published?:
Published
Last Modified:
15 Jul 2024 13:09