Fast prediction and optimization of yield in gallium arsenide large-signal MMICs

D'Agostino, S and Paoloni, C (1998) Fast prediction and optimization of yield in gallium arsenide large-signal MMICs. International Journal of RF and Microwave Computer-Aided Engineering, 8 (1). pp. 68-76. ISSN 1096-4290

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Abstract

A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.

Item Type:
Journal Article
Journal or Publication Title:
International Journal of RF and Microwave Computer-Aided Engineering
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
ID Code:
56565
Deposited By:
Deposited On:
08 Aug 2012 18:26
Refereed?:
Yes
Published?:
Published
Last Modified:
01 Jan 2020 08:02