Testing high resolution SD ADC’s by using the noise transfer function

Richardson, Andrew and De-Venuto, Daniela (2004) Testing high resolution SD ADC’s by using the noise transfer function. In: 9th IEEE European Test Symposium, 2004-05-232004-05-26.

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A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC’s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysis demonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques.

Item Type: Contribution to Conference (Paper)
Journal or Publication Title: 9th IEEE European Test Symposium
Departments: Faculty of Science and Technology > Engineering
ID Code: 51081
Deposited By: ep_importer_pure
Deposited On: 16 Nov 2011 13:54
Refereed?: Yes
Published?: Published
Last Modified: 10 Jun 2019 20:29
URI: https://eprints.lancs.ac.uk/id/eprint/51081

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