Richardson, Andrew and Rosing, Richard and Peyton, Anthony and Dorey, Anthony (1999) Test support strategies for MEMS. In: 5th IEEE International Mixed Signal Testing Workshop, 1999-06-15 - 1999-06-18.
Preview
PDF
IMSTW99_rr.pdf - Accepted Version
Available under License Creative Commons Attribution Non-commercial No Derivatives.
Download (146kB)
IMSTW99_rr.pdf - Accepted Version
Available under License Creative Commons Attribution Non-commercial No Derivatives.
Download (146kB)
Abstract
Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process. This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market.
Item Type:
Contribution to Conference
(Paper)
Journal or Publication Title:
5th IEEE International Mixed Signal Testing Workshop
Departments:
ID Code:
51061
Deposited By:
Deposited On:
15 Nov 2011 16:27
Refereed?:
Yes
Published?:
Published
Last Modified:
11 Oct 2024 00:46