An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

Richardson, Andrew and Sharif, Erfaan and Dorey, Anthony (1998) An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems. In: 4th IEEE International Mixed-Signal Testing Workshop, 1998-06-081998-06-11.

[img]
Preview
PDF
IDR_for_Fault_Tolerant_Mixed_Signal_Systems.pdf - Accepted Version
Available under License Creative Commons Attribution Non-commercial No Derivatives.

Download (1MB)

Abstract

An Integrated Diagnostic Reconfiguration (IDR) approach is presented that is compatible with a range of mixed signal circuits and sensors used in high dependability systems. The technique achieves improved testability, diagnostic capabilities and fault tolerance through reconfiguration. The approach has been used to implement a prototype fault-tolerant interface ASIC for a piezoresistive silicon pressure sensor. This paper will describe the technique, an application and present results from measurements on the silicon implementation.

Item Type:
Contribution to Conference (Paper)
Journal or Publication Title:
4th IEEE International Mixed-Signal Testing Workshop
Subjects:
ID Code:
51057
Deposited By:
Deposited On:
15 Nov 2011 15:55
Refereed?:
No
Published?:
Published
Last Modified:
24 Nov 2020 10:26