Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1996) Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. Quality Engineering, 8 (4). pp. 601-613. ISSN 1532-4222

Full text not available from this repository.
Item Type:
Journal Article
Journal or Publication Title:
Quality Engineering
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2200/2209
Subjects:
?? microsystemssmart sensors self-test testability diagnosis qualityindustrial and manufacturing engineeringsafety, risk, reliability and quality ??
ID Code:
50865
Deposited By:
Deposited On:
08 Nov 2011 11:35
Refereed?:
Yes
Published?:
Published
Last Modified:
15 Jul 2024 12:27