Fault simulation for MEMS

Rosing, R. and Richardson, A. and Dorey, A. and Peyton, A. (1999) Fault simulation for MEMS. In: Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. UNSPECIFIED, 7/1 -7/6.

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Abstract

Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process. This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market

Item Type:
Contribution in Book/Report/Proceedings
Subjects:
ID Code:
50462
Deposited By:
Deposited On:
21 Oct 2011 08:27
Refereed?:
Yes
Published?:
Published
Last Modified:
16 May 2020 00:58