Editorial: Mixed signal & analogue IC test technology

Richardson, A and Dorey, T (1996) Editorial: Mixed signal & analogue IC test technology. IEE Proceedings - Circuits, Devices and Systems, 143 (6). p. 357. ISSN 1350-2409

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Item Type:
Journal Article
Journal or Publication Title:
IEE Proceedings - Circuits, Devices and Systems
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2200/2208
Subjects:
ID Code:
50460
Deposited By:
Deposited On:
20 Oct 2011 15:35
Refereed?:
Yes
Published?:
Published
Last Modified:
17 Sep 2020 01:12