Moiseev, K. D. and Krier, A. and Yakovlev, Y. P. (2001) Interface photoluminescence in type II broken-gap P-Ga0.84In0.16As0.22Sb0.78/p-InAs single heterostructures. . Journal of Applied Physics, 90 (8). pp. 3988-3992. ISSN 1089-7550
Abstract
Mid-infrared photoluminescence has been observed from interface transitions in high quality, abrupt P-Ga0.84In0.16As0.22Sb0.78/p-InAs heterojunctions grown by liquid phase epitaxy from an In-rich melt. The Ga0.84In0.16As0.22Sb0.78 quaternary epitaxial layer was unintentionally doped and grown lattice matched on to a (100) oriented p-type InAs substrate, resulting in a P-p isotype heterojunction. The photoluminescence emission spectra were investigated and exhibited three pronounced emission bands in the spectral region from 0.30 to 0.68 eV; h nu (1) = 0.317 eV, h nu (2) = 0.380 eV, and h nu (L) = 0.622 eV. The emission band h nu (1) was identified with radiative transitions between electron and hole quantum well subbands in the semimetal channel at the P-GaIn0.03As0.10Sb/p-InAs interface, while the h nu (2) band originates from radiative transitions involving deep acceptor states in the InAs substrate. The high-energy recombination h nu (L) is characteristic of the Ga0.84In0.16As0.22Sb0.78 bulk quaternary layer. (C) 2001 American Institute of Physics.