Ma, X. and Zhou, C. and Kemp, I. J. (2002) Automated wavelet selection and thresholding for PD detection. IEEE Electrical Insulation Magazine, 18 (2). pp. 37-45. ISSN 0883-7554
Full text not available from this repository.
Official URL: https://doi.org/10.1109/57.995398
Abstract
Presents a discussion of some important and unresolved issues related to previous work to provide a more comprehensive understanding of the practicability of wavelet-based denoising.
Item Type:
Journal Article
Journal or Publication Title:
IEEE Electrical Insulation Magazine
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/tk
Subjects:
?? PARTIAL DISCHARGE (PD)PD DETECTIONWAVELETWAVELET TRANSFORM (WT)NOISE REDUCTIONELECTRONIC, OPTICAL AND MAGNETIC MATERIALSELECTRICAL AND ELECTRONIC ENGINEERINGTK ELECTRICAL ENGINEERING. ELECTRONICS NUCLEAR ENGINEERING ??
Departments:
ID Code:
34929
Deposited By:
Deposited On:
15 Dec 2010 09:30
Refereed?:
Yes
Published?:
Published
Last Modified:
18 Sep 2023 00:18