Towards chemical mapping at sub-micron resolution : near-field spectroscopic delineation of interphase boundaries.

Pollock, Hubert M. (2010) Towards chemical mapping at sub-micron resolution : near-field spectroscopic delineation of interphase boundaries. Materials Science Forum, 662. pp. 1-11. ISSN 0255-5476

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Abstract

Several of the authors of this collection of papers presented at the international meeting on the mechanical behaviour of materials have been working continuously in that field for several decades. In contrast, in this instance we have an example of an author who, having some experience in nanoindentation and surface - mechanical research, now pursues interdisciplinary studies of nanoscale properties in a different field. This paper discusses how a near-field version of infrared microspectroscopy, together with multivariate data analysis points a way towards a new method for identifying biomarkers for use in biomedical evaluation procedures. We also outline some details of a non-statistical method of classification, employing fuzzy logic.

Item Type: Journal Article
Journal or Publication Title: Materials Science Forum
Uncontrolled Keywords: /dk/atira/pure/researchoutput/libraryofcongress/qc
Subjects:
Departments: Faculty of Science and Technology > Physics
ID Code: 34292
Deposited By: Dr H M Pollock
Deposited On: 28 Sep 2010 09:55
Refereed?: Yes
Published?: Published
Last Modified: 18 Sep 2019 23:42
URI: https://eprints.lancs.ac.uk/id/eprint/34292

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