Designing reliable digital molecular electronic circuits.

Lei, Ci and Pamunuwa, Dinesh Bandara and Bailey, Stephen and Lambert, Colin (2009) Designing reliable digital molecular electronic circuits. In: Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering . Springer, Berlin, pp. 111-115. ISBN 978-3-642-04849-4

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Abstract

Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.

Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/qc
Subjects:
ID Code:
31659
Deposited By:
Deposited On:
01 Feb 2010 09:17
Refereed?:
Yes
Published?:
Published
Last Modified:
01 Jan 2020 05:21