Lei, Ci and Pamunuwa, Dinesh Bandara and Bailey, Stephen and Lambert, Colin (2009) Designing reliable digital molecular electronic circuits. In: Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering . Springer, Berlin, pp. 111-115. ISBN 978-3-642-04849-4
Full text not available from this repository.Abstract
Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.