Lifetime statistics in chaotic dielectric microresonators.

Schomerus, Henning and Wiersig, Jan and Main, Joerg (2009) Lifetime statistics in chaotic dielectric microresonators. Physical review a, 79 (5). 053806. ISSN 1050-2947

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Abstract

We discuss the statistical properties of lifetimes of electromagnetic quasibound states in dielectric microresonators with fully chaotic ray dynamics. Using the example of a resonator of stadium geometry, we find that a recently proposed random-matrix model very well describes the lifetime statistics of long-lived resonances, provided that two effective parameters are appropriately renormalized. This renormalization is linked to the formation of short-lived resonances, a mechanism also known from the fractal Weyl law and the resonance-trapping phenomenon.

Item Type:
Journal Article
Journal or Publication Title:
Physical review a
Additional Information:
©2009 The American Physical Society
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/qc
Subjects:
ID Code:
26642
Deposited By:
Deposited On:
19 Jun 2009 09:03
Refereed?:
Yes
Published?:
Published
Last Modified:
10 Jul 2020 01:49