Progress in near-field photothermal infra-red microspectroscopy.

Hammiche, A. and Bozec, L. and Pollock, Hubert M. and German, M. and Reading, M. (2004) Progress in near-field photothermal infra-red microspectroscopy. Journal of Microscopy, 213 (2). pp. 129-134. ISSN 0022-2720

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Near-field photothermal Fourier transform infra-red microspectroscopy, which utilizes atomic force microscopy (AFM)-type temperature sensors, is being developed with the aim of achieving a spatial resolution higher than the diffraction limit. Here we report on a new implementation of the technique. Sensitivity of the technique is assessed by recording infra-red spectra from small quantities of analytes and thin films. A photothermomechanical approach, which utilizes conventional AFM probes as temperature sensors, is also discussed based on preliminary results. Early indication suggests that the photothermal approach is more sensitive than the thermomechanical one.

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Journal Article
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Journal of Microscopy
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23 Feb 2009 09:17
Last Modified:
21 Nov 2022 19:13