Quality Assurance and Quality Control of the $26~\text{m}^2$ SiPM production for the DarkSide-20k dark matter experiment

Franchini, P. and Nowak, J. (2025) Quality Assurance and Quality Control of the $26~\text{m}^2$ SiPM production for the DarkSide-20k dark matter experiment. European Physical Journal C: Particles and Fields. ISSN 1434-6044 (In Press)

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Abstract

DarkSide-20k is a novel liquid argon dark matter detector currently under construction at the Laboratori Nazionali del Gran Sasso (LNGS) of the Istituto Nazionale di Fisica Nucleare (INFN) that will push the sensitivity for Weakly Interacting Massive Particle (WIMP) detection into the neutrino fog. The core of the apparatus is a dual-phase Time Projection Chamber (TPC), filled with \SI{50} {tonnes} of low radioactivity underground argon (UAr) acting as the WIMP target. NUV-HD-Cryo Silicon Photomultipliers (SiPM)s designed by Fondazione Bruno Kessler (FBK) (Povo, Trento, Italy) were selected as the photon sensors covering two $10.5~\text{m}^2$ Optical Planes, one at each end of the TPC, and a total of $5~\text{m}^2$ photosensitive surface for the liquid argon veto detectors. This paper describes the Quality Assurance and Quality Control (QA/QC) plan and procedures accompanying the production of FBK~NUV-HD-Cryo SiPM wafers manufactured by LFoundry s.r.l. (Avezzano, AQ, Italy). SiPM characteristics are measured at 77~K at the wafer level with a custom-designed probe station. As of May~2024, 603 of the 1400 production wafers (43\% of the total) for DarkSide-20k were tested, including wafers from all 57 production Lots. The wafer yield is $93.6\pm2.5$\%, which exceeds the 80\% specification defined in the original DarkSide-20k production plan.

Item Type:
Journal Article
Journal or Publication Title:
European Physical Journal C: Particles and Fields
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/3100/3101
Subjects:
?? physics.ins-detphysics and astronomy (miscellaneous)engineering (miscellaneous) ??
ID Code:
228978
Deposited By:
Deposited On:
22 Apr 2025 09:25
Refereed?:
Yes
Published?:
In Press
Last Modified:
26 Apr 2025 23:56