BIST and diagnostics for safety critical microsystems.

Olbrich, T. and Richardson, A. M. D. and Bradley, D. A. (1994) BIST and diagnostics for safety critical microsystems. In: Proceedings of an ESREF conference. UNSPECIFIED, Glasgow, pp. 511-518.

Full text not available from this repository.
Item Type: Contribution in Book/Report/Proceedings
Uncontrolled Keywords: /dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
Departments: Faculty of Science and Technology > Engineering
ID Code: 20581
Deposited By: ep_ss_importer
Deposited On: 02 Dec 2008 15:31
Refereed?: No
Published?: Published
Last Modified: 29 Jul 2019 23:16
URI: https://eprints.lancs.ac.uk/id/eprint/20581

Actions (login required)

View Item View Item