BIST and diagnostics for safety critical microsystems.

Olbrich, T. and Richardson, A. M. D. and Bradley, D. A. (1994) BIST and diagnostics for safety critical microsystems. In: Proceedings of an ESREF conference. UNSPECIFIED, Glasgow, pp. 511-518.

Full text not available from this repository.
Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
ID Code:
20581
Deposited By:
Deposited On:
02 Dec 2008 15:31
Refereed?:
No
Published?:
Published
Last Modified:
27 Apr 2020 23:42