Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.

Olbrich, T. and Perez, J. and Grout, I. and Richardson, A. and Ferrer, C. (1996) Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. In: Proceedings of the international test conference 1996. UNSPECIFIED, Washington DC, pp. 511-520. ISBN 0780335406

Full text not available from this repository.
Item Type: Contribution in Book/Report/Proceedings
Uncontrolled Keywords: /dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
Departments: Faculty of Science and Technology > Engineering
Faculty of Science and Technology > School of Computing & Communications
ID Code: 20424
Deposited By: ep_ss_importer
Deposited On: 12 Dec 2008 11:51
Refereed?: No
Published?: Published
Last Modified: 22 Jun 2019 23:24
URI: https://eprints.lancs.ac.uk/id/eprint/20424

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