Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.

Olbrich, T. and Perez, J. and Grout, I. and Richardson, A. and Ferrer, C. (1996) Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. In: Proceedings of the international test conference 1996 :. UNSPECIFIED, Washington DC, pp. 511-520. ISBN 0780335406

Full text not available from this repository.
Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? ta engineering (general). civil engineering (general) ??
ID Code:
20424
Deposited By:
Deposited On:
12 Dec 2008 11:51
Refereed?:
No
Published?:
Published
Last Modified:
16 Jul 2024 01:43