Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.

Olbrich, T. and Perez, J. and Grout, I. and Richardson, A. and Ferrer, C. (1996) Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. In: Proceedings of the international test conference 1996. UNSPECIFIED, Washington DC, pp. 511-520. ISBN 0780335406

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/dk/atira/pure/researchoutput/libraryofcongress/ta
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20424
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Deposited On:
12 Dec 2008 11:51
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Published
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20 Jun 2020 23:21