Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

Burbidge, M. and Richardson, Andrew M. D. and Lechner, A. (2001) Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In: Proceedings of the 7th IEEE international test workshop. UNSPECIFIED, pp. 97-102.

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Item Type: Contribution in Book/Report/Proceedings
Uncontrolled Keywords: /dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
Departments: Faculty of Science and Technology > Engineering
ID Code: 20243
Deposited By: ep_ss_importer
Deposited On: 19 Dec 2008 13:56
Refereed?: No
Published?: Published
Last Modified: 21 Jun 2019 23:42
URI: https://eprints.lancs.ac.uk/id/eprint/20243

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