Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

Burbidge, M. and Richardson, Andrew M. D. and Lechner, A. (2001) Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In: Proceedings of the 7th IEEE international test workshop. UNSPECIFIED, pp. 97-102.

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Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
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ID Code:
20243
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Deposited On:
19 Dec 2008 13:56
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No
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Published
Last Modified:
03 Dec 2020 07:31